1. Digital hardware testing. transistor-level fault modeling and testing
Author: Rajsuman, Rochit., Rochit Rajsuman
Library: Library and Documentation Center of Kurdistan University (Kurdistan)
Subject: ، Electronic digital computers- Circuits- Testing- Data processing,، Integrated circuits- Very large scale integration- Testing- Data processing,، Electric fault location
Classification :
TK
7888
.
4
.
R35
2. Fault detection in digital circuits
Author: / (by) Arthur D. Friedman (and) Premachandran R. Menon
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Electronic digital computers - Circuits - Testing,Electric fault location
Classification :
TK
7887
.
F75
